| commit | cb6c99f31174f0cc3b2c20c9eeef721b0cabb790 | [log] [tgz] |
|---|---|---|
| author | Sean Dague <sean.dague@samsung.com> | Mon Jan 20 19:37:59 2014 -0500 |
| committer | Sean Dague <sean.dague@samsung.com> | Mon Jan 20 19:37:59 2014 -0500 |
| tree | e08760deb7bfb462890385e4eb7fe0a21b58b4f7 | |
| parent | 9abd422edacc84f60097b0dedc6638bd29d2113d [diff] |
skip test_volume_boot_pattern this test is failing a lot, in a lot of different ways. It's currently triggering a non negligible amount of gate resets. Skip this so we can work on figuring out the base issue separate from code merging upstream. Change-Id: I7ded4f10f555e760bebd6a40a15e0990c95458e0