)]}'
{
  "commit": "cb6c99f31174f0cc3b2c20c9eeef721b0cabb790",
  "tree": "e08760deb7bfb462890385e4eb7fe0a21b58b4f7",
  "parents": [
    "9abd422edacc84f60097b0dedc6638bd29d2113d"
  ],
  "author": {
    "name": "Sean Dague",
    "email": "sean.dague@samsung.com",
    "time": "Mon Jan 20 19:37:59 2014 -0500"
  },
  "committer": {
    "name": "Sean Dague",
    "email": "sean.dague@samsung.com",
    "time": "Mon Jan 20 19:37:59 2014 -0500"
  },
  "message": "skip test_volume_boot_pattern\n\nthis test is failing a lot, in a lot of different ways. It\u0027s\ncurrently triggering a non negligible amount of gate resets.\n\nSkip this so we can work on figuring out the base issue\nseparate from code merging upstream.\n\nChange-Id: I7ded4f10f555e760bebd6a40a15e0990c95458e0\n",
  "tree_diff": [
    {
      "type": "modify",
      "old_id": "2a2b5278a8aa6e6340d575678e986cbd5ec5f57a",
      "old_mode": 33188,
      "old_path": "tempest/scenario/test_volume_boot_pattern.py",
      "new_id": "7d30478cfa483d9726f849e639aeb06d09ef9886",
      "new_mode": 33188,
      "new_path": "tempest/scenario/test_volume_boot_pattern.py"
    }
  ]
}